This study proposes an optimal accelerated life test (ALT) design process for gears and bearings using a novel equivalent damage method (EDM). The process first calculates the damage incurred by each ...
The Pester PowerShell module allows for some flexibility in how tests are written, but as Adam notes, there are still a few key points to consider. Have you ever wanted to verify that a PowerShell ...
My colleagues from Mentor Graphics, Ron Press, Martin Keim, and I often write about various aspects of digital IC test. If you started following the Test Voices blog when it was part of Test & ...
Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...
The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
As a wide range of direct bandgap semiconductor material, aluminum nitride (AlN) has been extensively investigated due to its high piezoelectric coefficient and thermal conductivity, and excellent ...
As part of system development, many industries, including the automobile industry, make substantial use of modeling and simulation to help understand system performance. Modeling and simulation ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
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