Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...

A team of scientists in the United States has combined both spatial and temporal attention mechanisms to develop a new approach for PV inverter fault detection. Training the new method on a dataset ...

An analysis of the response of buried continuous pipelines to active faults has led to development of a design guideline for both onshore and offshore pipelines at fault crossings. A fault movement ...