Characterize much more than just nanoscale topographic features. Atomic force microscopy is an umbrella term comprising dozens of complementary “modes” of operation. These different modes can not only ...

This handbook illustrates the wide variety of operating modes available on Bruker AFMs, going well beyond the standard high‑resolution topographic imaging capabilities of AFM. The modes are broken ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...

Atomic force microscopy (AFM) is a versatile microscopic technology used for analyzing various samples at the nanoscale dimension. This analytical tool not only offers a three-dimensional image of the ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

This release is available in German. Jena (21 October 2010) Scientists from the Friedrich-Schiller-University Jena (Germany) were successful in improving a fabrication process for Atomic Force ...

May 16, 2014. Agilent Technologies Inc. has introduced its AFM-enabled scanning electrochemical microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform ...

Abu Dhabi, UAE, July 26, 2022: A team of researchers from NYU Abu Dhabi’s Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in ...