An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announces today the release of Vero, the first and only AFM with Quadrature Phase Differential Interferometry (QPDI) ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...

From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Technology advances have steadily been implemented to improve the performance of commercial atomic force microscopes (AFMs) since the release of the first commercial model about 30 years ago. Now, the ...

Two studies published in 2022 demonstrate machine learning techniques employed to reduce uncertainty in atomic force microscopy (AFM). Making AFM more accurate with artificial intelligence (AI) could ...

Atomic Force Microscopy (AFM) is a powerful scanning probe microscopy technique that provides high-resolution imaging and measurement of surface properties at the nanoscale. It operates by using a ...

The AFM is a safe instrument, but the user should observe general precautions prior to using the instrument. The system uses high voltages and currents of up to 165 V and 0.5 A, respectively. Make ...

Nanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Their core technologies are microscopy, ...